SECM is one of the fastest growing techniques used in scanning probe electrochemistry. Standard scanning electrochemical microscopy does not have the ability to distinguish differences in topographical induced changes and electrochemical induced changes.
Ic-SECM is a simple way to maintain very close probe-sample proximity. ic-SECM470 introduces a brand new technique to overcome these limitations by using an innovative tip positioning method that allows surface topography and activity to be resolved simultaneously and independently.
The intermittent contact technique allows an SECM probe to maintain the same degree of contact with the sample over the course of a scan.
Conventional SECM modulation and measurement of the probe and sample electrochemistry can be made whilst the intermittent contact control is in operation.
M470 is available with a choice of potentiostat/galvanostat/FRAs: in place of the 3300, which is built-in the M470, the SP-300 can now be used with the M470.
Positioning system specifications
Piezoelectric element (for z axis only)