Super User M470 – ac/dc-SECM SECM is one of the fastest growing of the scanning probe electrochemistry techniques. Its many application areas include the study of surface modification, monitoring of biological activity and imaging immobilized enzymes The 3300 bi-potentiostat can make ultra-low current, low noise measurements simultaneously at the tip and substrate to extend the instruments ability to address specialist applications in surface science and the study of living cells. The ac-SECM is a new technique that has the capability to measure surface phenomena without the presence of a mediator. This feature allows the SECM technique to be used in the field of corrosion science. The SECM technique can be combined with the OSP470 module or the ic-SECM470 module to allow the technique to make both constant height and constant distance measurements. Discover ic-SECM technique in video… M470 is available with a choice of potentiostat/galvanostat/FRAs: in place of the 3300, which is built-in the M470, the SP-300 can now be used with the M470. DocumentsOptionsSpecificationsAccessories M470 – ac/dc-SECM Support M470 Brochure Products Catalog Accessories Catalog Read more SP-300 + M470Read more Potentiostat Compliance voltage: ±12 V Applied potential: ±10 V FSR Resolution: 32-bit (4.7 nV) Measured potential: ±10 V FSR Resolution: 24-bit (1.2 μV) Current ranges: 10-decades 1 nA to 1 A Maximum current: 500 mA Current resolution: 23.8 fA Accuracy: >0.5% Floating capability Standard Cell connections 2, 3 or 4 Maximum ADC sample rate: 4 MHz Maximum ADC resolution: 24-bit Minimum pulse duration: 100 μs Scan rate: 1 μV/s to 200 V/s EIS Capability Frequency range: 1 µHz to 1 MHz Analyser accuracy: 0.1%, 0.1° Frequency resolution 66 nHz Mode Single sine, Multisine, FFT analysis Positioning system specifications Stepper Motors Scan Range (x,y,z): 110 mm x 110 mm x 110 mm Minimal step size on all axes: 20 nm Closed loop positioning linear zero hysteresis encoder with direct real-time readout of displacement in x, y and z Linear position encoder resolution: 20 nm. Max. scan speed: 10 mm/s Measurement resolution: 32-bit decoder @ up to 40 MHz Piezoelectric element (for z axis only) Vibration range 20 nm – 2 µm peak to peak with 1 nm increments Min. vibration resolution: 0.12 nm calculated (16-bit DAC on 4 µm) Piezo crystal extension: 100 µm Positioning resolution: 0.09 nm calculated (20-bit DAC on 100 µm) Read more Various probe options µTriCell™ Shallow µTriCell™ Long working distance optical video microscope (VCAM3) 3D shaded surface rendering software (3DIsoPlot™) MIRA software for data analysis and visualisation Read more
