M470 – SKP The Model SKP470 Scanning Kelvin Probe operates using a vibrating capacitance probe and through a swept backing potential, the work function difference is measured between the scanned probe reference tip and sample surface. Read more …
M470 – SVP This enables the user to map and quantify localised electrochemical and corrosion events in real time. The probe vibration is controlled by a piezo-ceramic displacement device allowing vibration amplitudes from 1 – 30 μm (perpendicular to the sample surface). Read more …