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  3. Scanning systems

Scanning systems

M470 – SKP

secm 470 150x150

The Model SKP470 Scanning Kelvin Probe operates using a vibrating capacitance probe and through a swept backing potential, the work function difference is measured between the scanned probe reference tip and sample surface.

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M470 – SVP

secm 470 150x150

This enables the user to map and quantify localised electrochemical and corrosion events in real time.

The probe vibration is controlled by a piezo-ceramic displacement device allowing vibration amplitudes from 1 – 30 μm (perpendicular to the sample surface).

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